A Look At Bruker (BRKR) Valuation After New AFM IR Semiconductor Collaboration With Imec

Bruker (BRKR) is back in focus after announcing accelerated work on its photothermal AFM-IR spectroscopy, including a new collaboration with semiconductor research hub imec built around the Dimension ...

A roadmap for atomic force microscopy use in next-generation semiconductor and energy materials research

For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical ...
Nanowerk

Atomic force microscopy becomes a design tool for ferroelectric materials

A review paper presents an integrated AFM framework for observing, manipulating, and engineering ferroelectric materials at ...
Semiconductor Engineering

Study of EUV Nanostructures Using AFM With High-Aspect Ratio Tip (Purdue, Intel, Bruker)

A new technical paper, “Characterizing tip-sample interaction dynamics on extreme ultraviolet nanostructures using atomic ...
AZoM

Bruker Invests in Photothermal AFM-IR to Advance Semiconductor Research

Bruker Corporation today announced accelerated development of its photothermal AFM-IR spectroscopy capabilities to address ...
AZoNano

Using Atomic Force Microscopy (AFM) to Image Cells

Biological samples are often analyzed using atomic force microscopes (AFM), as they deliver a high resolution and are capable of operating under a range of physiological conditions. Using AFM fixed ...
Nanowerk

Improving AFM probe performance with a coat of graphene

(Nanowerk Spotlight) Most of the research efforts on developing synthesis methods for graphene has focused on flat substrates. Some groups have reported the formation of free-standing 3D ...
AZoNano

A Guide to AFM Sample Preparation

Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...